Substrate:SCHOTT / Xim iav ua nyob rau hauv Suav teb
Dimensional kam rau ua: -0.1 hli
Thickness kam rau ua: ±0.05 hli
Nto Flatness:1(0.5) @632.8nm
Nto Zoo: 40/20
Ntug:Hauv av, 0.3mm max. Tag nrho dav bevel
Clear Aperture: 90%
Parallelism:<5”
Txheej:xaiv tau