Substrate:B270
Dimensional kam rau ua: -0.1 hli
Thickness kam rau ua: ±0.05 hli
Nto Flatness:1(0.5) @632.8nm
Nto Zoo: 40/20
Ntug:Hauv av, 0.3mm max. Tag nrho dav bevel
Clear Aperture: 90%
Parallelism:<5”
Txheej:Ravg> 95% ntawm 740 txog 795 nm @ 45 ° AOI
Txheej:Ravg <5% ntawm 810 txog 900 nm @ 45 ° AOI